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Volume: 14, Issue: 1(2005)
pp. 27-50 DOI: 10.1142/S0218126605002167
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Abstract |
Full Text (PDF, 4,529KB)
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References
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| Title: |
EVALUATION OF TECHNOLOGY OPTIONS FOR SUBSTRATE NOISE REDUCTION |
| Author(s): |
MARIA RIZZI
Politecnico di Bari, Dipartimento di Elettrotecnica ed Elettronica, via E. Orabona, 4-70125 Bari, ItalyBENIAMINO CASTAGNOLO
Politecnico di Bari, Dipartimento di Elettrotecnica ed Elettronica, via E. Orabona, 4-70125 Bari, Italy
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| History: |
Received 2 December 2002
Revised 11 December 2003
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| Abstract: |
Substrate coupling is a phenomenon that affects the behavior and performance of RF and mixed signal ICs. Prediction of such crosstalk during the design process can help designers. In this paper, a new methodology is presented for performing a fast and reliable characterization of the noise transmission path, modeling the substrate as a resistive network. Adopting only DC measurement techniques, the dependence of disturbances attenuation on the geometric parameters is found. Moreover, the relation between attenuation and disturbance types is indicated. Finally, a qualitative comparison is made between the efficiency of the most commonly used technology measures against substrate crosstalk. |
| Keywords: |
Substrate noise; CMOS circuit; guard ring; anti-noise measures
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